Browsing by Author "Pusane, Ali E."
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Conference Object Kernel Density Estimation for Optimal Detection in All-Bit-Line MLC Flash Memories(IEEE, 2019) Ashrafi, Reza A.; Pusane, Ali E.; Arslan, Suayb S.NAND flash memories have recently become the main component of large-scale non-volatile storage systems. Recent studies have shown that various error sources degrade the Multi-level cell (MLC) memory performance, including inter-cell interference, retention error, and random telegraph noise. Accurate integration of these error sources into the analytical model to optimally derive the governing probability distributions and consequently the detection thresholds to minimize error rates lie at the heart of MLC research. Utilizing static derivations will not address the detection problem, as aforementioned error sources exhibit a strong non-stationary behavior. In this paper, a novel low-complexity implementation of a non-parametric learning mechanism, kernel density estimation, shall be used to periodically estimate the underlying probability distributions and hence approximate the optimal detection performance for time-varying all-bit-line MLC flash channel.Conference Object Next-Generation Data Storage: Transistor and Dna(Institute of Electrical and Electronics Engineers Inc., 2018) Pusane, Ali E.; Arslan, Şuayb Şefik; Ashrafi, Reza A.With the generation of diverse data growing at exponential rates, investigating better digital storage media is inevitable. Currently, one solution is the utilization of solid-state based memory devices, which offer several desirable characteristics, including very fast write/read operations, scalability, and reduced fabrication costs. However, with the increased need for long term and large storage space, their data retention capabilities drastically decline. Another emerging storage technology on the horizon is the biotechnological based DNA storage, which renders a phenomenal storage capacities. In this paper, basics of these two promising storage technologies are reviewed and their potential future trends are discussed. © 2018 IEEE.

