Facial Landmark Localization in Depth Images Using Supervised Ridge Descent
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Date
2015
Authors
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Journal ISSN
Volume Title
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Open Access Color
Green Open Access
Yes
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Publicly Funded
No
Abstract
Supervised Descent Method (SDM) has proven successful in many computer vision applications such as face alignment, tracking and camera calibration. Recent studies which used SDM, achieved state of the-art performance on facial landmark localization in depth images [4]. In this study, we propose to use ridge regression instead of least squares regression for learning the SDM, and to change feature sizes in each iteration, effectively turning the landmark search into a coarse to fine process. We apply the proposed method to facial landmark localization on the Bosphorus 3D Face Database; using frontal depth images with no occlusion. Experimental results confirm that both ridge regression and using adaptive feature sizes improve the localization accuracy considerably.
Description
Berk Gökberk (MEF Author)
Keywords
3d face analysis ???(key plus), 3D Face analysis ???(Key plus)
Turkish CoHE Thesis Center URL
Fields of Science
0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
Citation
Camgo?z, N. C., Struc, V., Gokberk, B., Akarun, L., & Kindirog?lu, A. A. (2015). Facial landmark localization in depth images using supervised ridge descent. Conference: IEEE International Conference on Computer Vision Workshops Location: santigo, CHILE. p. 378-383.
WoS Q
N/A
Scopus Q
N/A

OpenCitations Citation Count
9
Source
Conference: IEEE International Conference on Computer Vision Workshops Location: santigo, CHILE Date: DEC 11-18, 2015
Volume
Issue
Start Page
378
End Page
383
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CrossRef : 3
Scopus : 3
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Mendeley Readers : 23
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3
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Web of Science™ Citations
7
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Page Views
184
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Downloads
2278
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